china
/
japan
/
korea
Fact Sheet
Milestones
Company Overview
Robert Young
Michael Anthofer
Bernard Cassidy
Bob Roohparvar
Simon McElrea
Richard Chernicoff
Liam Goudge
H. Thomas Blanco
Executive Team
Robert Boehlke
John Goodrich
David Nagel
Robert Young
Kevin Rivette
Anthony Tether
Board of Directors
2011
2010
2009
2008
2007
2006
2005
2004
2003
News Releases
Image Library
Press Coverage
Legal Newsroom
Newsletter Sign-up
Press Room
Events
Investors
Innovation
Imaging & Optics
Lead Bonded
Wire Bonded
Chip Scale Packaging
Multi Chip Packaging
Flip Chip Packaging
Wafer-Level Packaging
Semiconductor Packaging
Package Substrate
Flip Chip Substrate
Substrate Interconnect
Thermal Management
Facilities and Capabilities
Licensees
Resources
Micro-Electronics
Technologies
Imaging & Optics
Micro-Electronics
Semiconductor Packaging
Substrate Interconnect
Thermal Management
Facilities and Capabilities
Licensees
Resources
Resources
Flip Chip Technology
Presentation: Reliability of µPILR™ Platform for Fine-Pitch Flip Chip Packages
White Paper: Reliability of Fine-Pitch Flip Chip Packages
White Paper: Packaging Challenges in High Performance Computing
Flyer: µPILR™ Flip Chip Interconnect
Package Substrate Solution
White Paper: Reliability of µPILR Packages under Shock Loading
White Paper: Micro Copper Contacts Replace BGA, Improve Reliability
White Paper: Package Reliability Using µPILR in Stacking and Flip Chip
Article: Package-on-Package is Killer App for Handsets
Thermal Management
White Paper: Silent Air Cooling for Laptops
Presentation: Silent Air Cooling for Laptops
Article: Cool Idea: Fan-Free Technology Could Put a Chill on Hot Laptops
Wafer Level Packaging
Flyer: OptiML Micro Via Pad
White Paper: Cost Reduction and Reliability Enhancement of Solid State Image Sensors by Wafer Level Chip Size Packaging Technology using New Materials
White Paper: Novel and Low Cost Through Silicon Via Solution for Wafer Scale Packaging of Image Sensors
White Paper:Low-Cost, Compliant Wafer-level Packaging Technology
White Paper: Low Cost Through Silicon Via Solution Compatible with Existing Assembly Infrastructure and Suitable for Single Die and Die Stacked Packages
White Paper: Optical Performance of Bare Image Sensor Die and Sensors Packaged at the Wafer Level and Protected by a Cover Glass
White Paper: High-Density, Wafer-Level Package Interconnect Providing a Reliable and Low-Cost Alternative to Through Silicon Vias for Image Sensors
© Copyright 2011 Tessera, Inc. All Rights Reserved.
Legal Info
|
Privacy Policy
Home
|
about tessera
|
technologies
|
applications
|
careers
|
contact us
|
site map